Using a Common Tester Architecture

Abstract

Reducing the cost of and time to develop automated test equipment (ATE) is a common goal for many organizations. This paper examines one effort to do that using a common architecture and tester executive for ATE. The history of the project and expected benefits are covered. Challenges encountered in its development are examined. This includes resistance from test engineers and architecture flexibility. These challenges also presented many opportunities for continuous improvement. In addition, this paper discusses how deviations from the architecture are handled. Finally, the actual realized benefits of this approach are described along with the path forward in gaining more from the architecture.