{"title":"Asynchronous Fault Detection in IEEE P1687 Instrument Network","authors":"K. Shibin, S. Devadze, A. Jutman","doi":"10.1109/NATW.2014.24","DOIUrl":null,"url":null,"abstract":"The paper describes asynchronous fault detection in silicon chips with network of embedded instruments based on IEEE P1687 IJTAG. This technique allows faster fault detection and localization by using asynchronous signal propagation from instruments to instrumentation network controller. The additional hardware is described, scenarios of operation including multiple simultaneous fault detection and localization are analysed.","PeriodicalId":283155,"journal":{"name":"2014 IEEE 23rd North Atlantic Test Workshop","volume":"271 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE 23rd North Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NATW.2014.24","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
Abstract
The paper describes asynchronous fault detection in silicon chips with network of embedded instruments based on IEEE P1687 IJTAG. This technique allows faster fault detection and localization by using asynchronous signal propagation from instruments to instrumentation network controller. The additional hardware is described, scenarios of operation including multiple simultaneous fault detection and localization are analysed.
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