{"title":"Reducing burn-in loss in organic photovoltaics by enhancing the morphological and interfacial stability (Conference Presentation)","authors":"Kyungkon Kim","doi":"10.1117/12.2531612","DOIUrl":null,"url":null,"abstract":"With rapid advances in the development of new conjugated polymers, non-fullerene acceptors, the power conversion efficiency (PCE) of OPVs has been increased over 14%. However, a major drawback for the commercialization of OPVs is their long-term stability under continuous operation. Especially, OPVs suffer from a rapid decrease in PCE during initial device operation, which is known as the “burn-in loss”. It is considered that the origin of the burn-in loss is mainly related with the instability of the BHJ morphology and/or interface rather than the photooxidation of the photoactive layer. We find that the photoactive layer prepared by a sequential solution deposition is more stable than that prepared by blend solution deposition. We also find that the burn-in loss is closely related with stability of photoactive layer / electron transporting layer interface.","PeriodicalId":342552,"journal":{"name":"Organic, Hybrid, and Perovskite Photovoltaics XX","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Organic, Hybrid, and Perovskite Photovoltaics XX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2531612","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
With rapid advances in the development of new conjugated polymers, non-fullerene acceptors, the power conversion efficiency (PCE) of OPVs has been increased over 14%. However, a major drawback for the commercialization of OPVs is their long-term stability under continuous operation. Especially, OPVs suffer from a rapid decrease in PCE during initial device operation, which is known as the “burn-in loss”. It is considered that the origin of the burn-in loss is mainly related with the instability of the BHJ morphology and/or interface rather than the photooxidation of the photoactive layer. We find that the photoactive layer prepared by a sequential solution deposition is more stable than that prepared by blend solution deposition. We also find that the burn-in loss is closely related with stability of photoactive layer / electron transporting layer interface.