D. Alexander, Alonzo Vera, James Aarestad, Gabriel V. Urbaitis
{"title":"Total dose testing of advanced mixed signal ADC/DAC microcircuits","authors":"D. Alexander, Alonzo Vera, James Aarestad, Gabriel V. Urbaitis","doi":"10.1109/NSREC.2017.8115443","DOIUrl":null,"url":null,"abstract":"Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115443","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.
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