M. O’Bryan, K. Label, E. Wilcox, Dakai Chen, M. Campola, M. Casey, J. Lauenstein, E. Wyrwas, S. Guertin, J. Pellish, M. Berg
{"title":"Compendium of current single event effects results from NASA goddard space flight center and NASA electronic parts and packaging program","authors":"M. O’Bryan, K. Label, E. Wilcox, Dakai Chen, M. Campola, M. Casey, J. Lauenstein, E. Wyrwas, S. Guertin, J. Pellish, M. Berg","doi":"10.1109/NSREC.2017.8115432","DOIUrl":null,"url":null,"abstract":"We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115432","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
