E. Wilcox, M. Campola, Seshagiri Nadendla, Madhu Kadari, Robert A. Gigliuto
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引用次数: 1
Abstract
Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latchup (SEL) protection circuitry.
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