Wafer Scale Encapsulation of Large Lateral Deflection MEMS Structures

A. B. Graham, M. Messana, P. Hartwell, J. Provine, S. Yoneoka, B. Kim, R. Melamud, R. Howe, T. Kenny
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引用次数: 4

Abstract

Packaging of microelectromechanical systems (MEMS) is a critical step in the transition from product development to production. This paper presents a robust, hermetically-sealed encapsulation method that can accommodate many traditional MEMS devices by allowing large lateral deflection structures within a clean environment. Using the new technology described in this paper, trench widths ranging from 1¿m to 100¿m were successfully encapsulated at the wafer level while maintaining devices as thick as 20¿m. Devices produced with this method have proven durable enough to withstand harsh post-processing such as dicing and wire bonding. Two different types of MEMS resonators are also discussed, demonstrating the use of both large and small trench widths within the encapsulation.
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大横向偏转MEMS结构的晶圆封装
微机电系统(MEMS)的封装是产品从开发到生产的关键环节。本文提出了一种坚固的密封封装方法,可以容纳许多传统的MEMS器件,允许在清洁的环境中进行大的横向偏转结构。使用本文中描述的新技术,在晶圆级上成功封装了宽度从1微米到100微米的沟槽,同时保持了厚度为20微米的器件。用这种方法生产的设备已被证明足够耐用,可以承受苛刻的后处理,如切割和电线粘合。还讨论了两种不同类型的MEMS谐振器,展示了在封装中使用大沟槽宽度和小沟槽宽度。
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