A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection

S. Hsiao, Nicholas Tzou, A. Chatterjee
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引用次数: 9

Abstract

Reference spur is a nonlinear effect and important specification in PLL for long term jitter. Periodic events of reference clock create a static phase offset between signals. The finite phase offset comes from charge pump mismatch and layout asymmetry. This paper presents a built-in self-test (BIST) circuit applied for PLL static phase offset (SPO) estimation. The proposed circuit takes advantage of an integrator for time-to-voltage conversion (TVC). Along with comparators and counters, a BIST can be constructed for an estimation of mismatch ratio down to 1% over process corners in simulation (10 psec for lnsec pulse width). The calibration can be operated in a closed-loop PLL with lock signal. Additional circuits including delay lines and non-inverting amplifiers are designed for fast calibration. The result shows at least 27 times faster detection speed can be achieved over process corners. The phase offset between PLL reference and feedback signal is essentially the duty cycle difference, and the test is also applied for duty cycle distortion. Related analysis and measurement are included.
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用于锁相环静态相位偏移估计和时钟占空比检测的可编程BIST设计
参考杂散是锁相环长期抖动的非线性效应和重要指标。参考时钟的周期性事件在信号之间产生静态相位偏移。有限相位偏移来自电荷泵不匹配和布局不对称。提出了一种用于锁相环静态相位偏移估计的内置自检(BIST)电路。该电路利用积分器进行时间-电压转换(TVC)。与比较器和计数器一起,可以构建一个BIST,用于在模拟过程拐角上估计低至1%的不匹配比率(脉冲宽度为10秒)。校准可以在带锁信号的闭环锁相环中操作。额外的电路,包括延迟线和非反相放大器的设计,以快速校准。结果表明,在工艺拐角处,检测速度至少可以提高27倍。锁相环参考信号与反馈信号之间的相位偏移实质上是占空比差,该测试也适用于占空比失真。包括相关的分析和测量。
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