Test of automotive embedded processors with high diagnostic resolution

Abstract

In state-of-the-art automotive controllers, functional tests are used to check their integrity in the field. Features dedicated to production test of integrated circuits such as scan-chains are not applied in the embedded system. However, such test structures enable a more effective and diagnostic test, which improves the fault analysis in case of a system failure and even increases system reliability. To archive this, an access to the integrated test logic is required. In this paper, we describe a concept of a test access to embedded systems via high-speed standard interfaces. The extended test logic as well as an appropriate test routine are presented.