High reliability encapsulant liquid resin for SIP

K. Nagai, Y. Ishikawa, A. Okuno
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Abstract

Liquid encapsulant resin and VPES (Vacuum Printing Encapsulation Systems) process were developed for SIP included FC and passive component, etc. with solder joint. In the case of RF module, PKG size can be made thin and small in comparison with the metal cap of the conventional technology. However, such module should repeatedly reflow for mounting on the mother board. Otherwise, it will cause the problem of the solder bridge inside of PKG when it is encapsulated by resin. In consideration of this point, this resin not only dropped down the coefficient of thermal expansion and the elastic modulus simultaneously, but also improved the adhesiveness. As a result, it is able to pass the severe pre-condition. Moreover, it succeeded in molding and underfilling simultaneously by using single-species resin in VPES process. Since there is no interface between underfill material and over mold resin inside of PKG, reliability can be improved further. This paper describes the unique of over molding process by VPES, liquid resin and its reliability.
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高可靠性SIP封装液体树脂
开发了液体封装树脂和真空打印封装系统(VPES)工艺,用于SIP包括FC和无源元件等带焊点。就射频模块而言,与传统技术的金属帽相比,PKG尺寸可以做得更薄更小。然而,这样的模块应该反复回流安装在主板上。否则在PKG被树脂封装时,会造成PKG内部焊料桥的问题。考虑到这一点,该树脂不仅降低了热膨胀系数和弹性模量,而且提高了粘接性。因此,它能够通过严重的先决条件。在VPES工艺中,采用单种树脂实现了成型和下填充的同时进行。由于PKG内部的下填料与上模树脂之间没有界面,因此可以进一步提高可靠性。介绍了VPES、液态树脂超成型工艺的独特性和可靠性。
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