Sergio Vinagrero Gutierrez, G. D. Natale, E. Vatajelu
{"title":"On-Line Reliability Estimation of Ring Oscillator PUF","authors":"Sergio Vinagrero Gutierrez, G. D. Natale, E. Vatajelu","doi":"10.1109/ETS54262.2022.9810418","DOIUrl":null,"url":null,"abstract":"In this paper we propose an on-line test methodology for RO-PUF reliability which enables high accuracy in the results since it is not based on predictive simplified models of the device variability and noise, but on actual technological electrical models and high versatility since it is not based on measurements extracted from a single technology.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS54262.2022.9810418","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper we propose an on-line test methodology for RO-PUF reliability which enables high accuracy in the results since it is not based on predictive simplified models of the device variability and noise, but on actual technological electrical models and high versatility since it is not based on measurements extracted from a single technology.