C. Miccoli, K. Sarpatwari, Domenico Di Cicco, Mattia Cichocki, V. Moschiano, P. Ruby, K. Parat
{"title":"Characterization and Modeling of Advanced Placement Algorithms for NAND Flash Arrays","authors":"C. Miccoli, K. Sarpatwari, Domenico Di Cicco, Mattia Cichocki, V. Moschiano, P. Ruby, K. Parat","doi":"10.1109/IMW.2015.7150279","DOIUrl":null,"url":null,"abstract":"This work aims at providing an accurate and flexible tool to simulate the most advanced placement algorithms for state-of-the-art NAND Flash devices. A model for incremental step pulse programming is discussed and experimentally validated, showing its capability to describe the dependence on the program pulse duration/amplitude and to correctly reproduce the proximity effect and the selective slow program convergence behavior, when a bit line/channel bias is applied. Finally, when the entire memory array is simulated in a Monte Carlo fashion, the placement of our decananometer 3bit/cell device can be accurately reproduced, including the behavior of the advanced programming features.","PeriodicalId":107437,"journal":{"name":"2015 IEEE International Memory Workshop (IMW)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2015.7150279","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This work aims at providing an accurate and flexible tool to simulate the most advanced placement algorithms for state-of-the-art NAND Flash devices. A model for incremental step pulse programming is discussed and experimentally validated, showing its capability to describe the dependence on the program pulse duration/amplitude and to correctly reproduce the proximity effect and the selective slow program convergence behavior, when a bit line/channel bias is applied. Finally, when the entire memory array is simulated in a Monte Carlo fashion, the placement of our decananometer 3bit/cell device can be accurately reproduced, including the behavior of the advanced programming features.