{"title":"Magnetic Bubble Reliability Testing - Component and System Level Aspects","authors":"J. Davies","doi":"10.1109/IRPS.1980.362918","DOIUrl":null,"url":null,"abstract":"Magnetic bubble memory components are extremely attractive for applications requiring high density, non-volatility and solid state reliability. Operating lifetest and accelerated stress test results are presented to classify the component error rates. Built-in error correction at the system level can improve error rates by several orders of magnitude. Calculated and measured error correction data are presented.","PeriodicalId":270567,"journal":{"name":"18th International Reliability Physics Symposium","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1980.362918","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Magnetic bubble memory components are extremely attractive for applications requiring high density, non-volatility and solid state reliability. Operating lifetest and accelerated stress test results are presented to classify the component error rates. Built-in error correction at the system level can improve error rates by several orders of magnitude. Calculated and measured error correction data are presented.
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