Study and reduction of variability in 28 nm FDSOI technology

G. Jacquemod, Zhaopeng Wei, Jad Modad, Y. Leduc, P. Lorenzini, F. Hameau, E. de Foucauld
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引用次数: 1

Abstract

This In this paper, we present a new inverter topology in order to decrease the process variability influence on performances of a ring oscillator. Using FDSOI technology, we used the back-gate electrode of the transistor to symmetrize the output of a complementary inverter. This technique will reduce the variability of the inverter and the jitter (i.e. the phase noise) of the ring oscillator. Complementary cells allow us to implement back-gate auto-biasing feedback without adding transistors and to realize a quadrature ring oscillator with an even number of inverters.
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28nm FDSOI技术可变性的研究与降低
本文提出了一种新的逆变器拓扑结构,以减少过程变异性对环形振荡器性能的影响。使用FDSOI技术,我们使用晶体管的后门电极来对称互补逆变器的输出。这种技术将减少逆变器的可变性和抖动(即环形振荡器的相位噪声)。互补单元允许我们在不增加晶体管的情况下实现反向自偏置反馈,并实现具有偶数逆变器的正交环振荡器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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