William Rice, Marlon Marquez, Tejinder Jaswal, Salvatore Caruso, Armando Rivera Gil
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Abstract
A custom-designed test chip built on Global Foundries 22FDX® technology was investigated for its response to TID and SEE environments. While measurements of the performance for the technology in a first design match well with some reported results from prior testing, the use of a second custom radiation-hardened design demonstrated a significant 6x improvement in the per-bit cross section for a shift register test structure.
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