{"title":"Pad printer","authors":"G. Love, G. Maher, N. Long","doi":"10.1109/IEMT.1996.559721","DOIUrl":null,"url":null,"abstract":"We present the results of alpha-site testing of a pad printer for thick film technology, including uniformity, reproducibility, physical and electrical characterization of conductor and resistor patterns in single-layer (hybrid) configurations and in multi-layer co-fired designs.","PeriodicalId":177653,"journal":{"name":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","volume":"420 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1996.559721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We present the results of alpha-site testing of a pad printer for thick film technology, including uniformity, reproducibility, physical and electrical characterization of conductor and resistor patterns in single-layer (hybrid) configurations and in multi-layer co-fired designs.
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