Automated generation of SPICE characterization test masks and test databases

Abstract

This paper presents procedures and software tools for automatic generation of test masks, and mask and measurement databases, for SPICE model characterization. The process uses Cadence Pcells, and requires user specification only of a small amount of biasing information. The tools generate device instances, place and route the devices, extract test array coordinates and contents from layout for auto-probing, generate measurement test plans, and generate test mask documentation.