Tooling for wafer and photomask cleaning and surface preparation using a dry, laser-assisted technology

A. Engelsberg, T. Lizotte, O. Ohar, T. R. O'Keefe
{"title":"Tooling for wafer and photomask cleaning and surface preparation using a dry, laser-assisted technology","authors":"A. Engelsberg, T. Lizotte, O. Ohar, T. R. O'Keefe","doi":"10.1109/IEMT.1996.559735","DOIUrl":null,"url":null,"abstract":"The semiconductor industry is entering into an era of global competitiveness that needs to factor in the economics of capital and operational costs along with environmental compliance to operate profitable fabricators. Innovative manufacturing technologies will be required to meet the technological and cost requirements. This paper introduces a new technology for cleaning and surface preparation called the Radiance Process. It operates under quantum mechanical principles using only photons of light and a laminar flowing inert gas, which makes it environmentally friendly. The technology has been demonstrated to remove the following types of contamination in a one-step process that does not damage the underlying surface: Particles (organic, inorganic and metallic), metallic ions, oxides, and thin films (organic and inorganic). With its inherent simplicity, flexibility, and modular tool design, the technology can accommodate stand-alone and cluster modules as well as multiple substrate dimensions. Projected cost-of-ownership figures indicate that this technology is significantly less expensive than current wet-chemical-based processes because infrastructure for water and chemical usage and disposal is not required. This paper describes our technology, its developmental results, tool design and projected cost-of-ownership figures.","PeriodicalId":177653,"journal":{"name":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1996.559735","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The semiconductor industry is entering into an era of global competitiveness that needs to factor in the economics of capital and operational costs along with environmental compliance to operate profitable fabricators. Innovative manufacturing technologies will be required to meet the technological and cost requirements. This paper introduces a new technology for cleaning and surface preparation called the Radiance Process. It operates under quantum mechanical principles using only photons of light and a laminar flowing inert gas, which makes it environmentally friendly. The technology has been demonstrated to remove the following types of contamination in a one-step process that does not damage the underlying surface: Particles (organic, inorganic and metallic), metallic ions, oxides, and thin films (organic and inorganic). With its inherent simplicity, flexibility, and modular tool design, the technology can accommodate stand-alone and cluster modules as well as multiple substrate dimensions. Projected cost-of-ownership figures indicate that this technology is significantly less expensive than current wet-chemical-based processes because infrastructure for water and chemical usage and disposal is not required. This paper describes our technology, its developmental results, tool design and projected cost-of-ownership figures.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
使用干燥的激光辅助技术进行晶圆和光掩膜清洁和表面制备的工具
半导体行业正在进入一个全球竞争的时代,需要考虑资本和运营成本的经济性以及环境合规,以运营盈利的制造商。将需要创新的制造技术来满足技术和成本要求。本文介绍了一种新的清洁和表面处理技术,称为辐光工艺。它在量子力学原理下运行,只使用光子和层流惰性气体,这使得它对环境友好。该技术已被证明可以在一步的过程中去除以下类型的污染,而不会损坏下面的表面:颗粒(有机、无机和金属)、金属离子、氧化物和薄膜(有机和无机)。凭借其固有的简单性、灵活性和模块化工具设计,该技术可以适应独立和集群模块以及多种基板尺寸。预计的拥有成本数字表明,这项技术比目前的湿化学工艺便宜得多,因为不需要水和化学品使用和处置的基础设施。本文描述了我们的技术,它的发展成果,工具设计和预计的拥有成本数字。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Statistical optimization of high frequency LDMOS devices via hyper-fractionated experimental designs High temperature deformation of high density interconnects and packages by moire interferometry/FEM hybrid method Microsystems for medical applications The manufacturing logistics of cofire ceramic electronic packages Eutectic solder flip chip technology for chip scale package
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1