{"title":"CMOS performance and density trends as we approach 0.1 /spl mu/m","authors":"T. Ning","doi":"10.1109/ICSICT.1998.785768","DOIUrl":null,"url":null,"abstract":"The technology development required to sustain the CMOS performance and density trends near and beyond 0.1 /spl mu/m is examined. It is concluded that we are fast approaching the limits of scaling conventional (bulk) CMOS. We need to look beyond scaling bulk CMOS in order to sustain the rate of CMOS performance improvement.","PeriodicalId":286980,"journal":{"name":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","volume":"307 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT.1998.785768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The technology development required to sustain the CMOS performance and density trends near and beyond 0.1 /spl mu/m is examined. It is concluded that we are fast approaching the limits of scaling conventional (bulk) CMOS. We need to look beyond scaling bulk CMOS in order to sustain the rate of CMOS performance improvement.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
