T. Takamoto, H. Okazaki, H. Takamura, M. Ohmori, M. Ura, M. Yamaguchi
{"title":"Radiation effects on n/sup +/-p homojunction indium phosphide solar cells","authors":"T. Takamoto, H. Okazaki, H. Takamura, M. Ohmori, M. Ura, M. Yamaguchi","doi":"10.1109/ICIPRM.1990.202987","DOIUrl":null,"url":null,"abstract":"The energy dependence of proton damage in n/sup +/-p homojunction InP solar cells and the shielding effects of a very thin coverglass (50 mu m) against proton and electron irradiation are described. The degradation mechanism is found to depend on the proton's penetration depth. Low-energy protons stopped in the active region cause the degradation in short-circuit current. with protons stopped at the junction causing the maximum degradation in conversion efficiency. High-dose protons stopped in the p-type substrate produce a high-resistance layer at the end of the proton tracks. A 50- mu m coverglass is found to shield the cell from low-energy protons, which is effective because InP solar cells are highly resistant against electron and high-energy-proton irradiation.<<ETX>>","PeriodicalId":138960,"journal":{"name":"International Conference on Indium Phosphide and Related Materials","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Indium Phosphide and Related Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1990.202987","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The energy dependence of proton damage in n/sup +/-p homojunction InP solar cells and the shielding effects of a very thin coverglass (50 mu m) against proton and electron irradiation are described. The degradation mechanism is found to depend on the proton's penetration depth. Low-energy protons stopped in the active region cause the degradation in short-circuit current. with protons stopped at the junction causing the maximum degradation in conversion efficiency. High-dose protons stopped in the p-type substrate produce a high-resistance layer at the end of the proton tracks. A 50- mu m coverglass is found to shield the cell from low-energy protons, which is effective because InP solar cells are highly resistant against electron and high-energy-proton irradiation.<>