DFX and Productivity

Abstract

CMOS scaling has led to ever-increasing numbers of potentially available transistors on chips. At the same time, design productivity has also continued to improve, but has not been able to keep up, resulting in increasing design effort. Many factors contribute to this situation, but one key element is the complexity involved in ensuring that yield targets will be met. (DFY). This talk outlines the basics of design-for-yield (DFY) and shows how it relates to design-for-manufacturability, test, and variability (DFM, DFT, and DFV respectively). It is shown how a comprehensive approach to all of the problems, known as DFX, can lead to improved design methodology and hence improved productivity.