{"title":"A Novel Methodology for Functional Test Data Compression","authors":"H. Hashempour, F. Lombardi","doi":"10.1109/DFT.2006.9","DOIUrl":null,"url":null,"abstract":"This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits","PeriodicalId":113870,"journal":{"name":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2006.9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a novel approach for compressing functional test data in automatic test equipment (ATE). A practical technique is presented for 2 dimensional (2D) reordering of test data in which additionally to test vector reordering, column reordering is also applied. An ATE based approach to extract the original test vectors from the 2D ordered data is presented. The advantage of the approach is substantiated using the figure of merit of entropy for the 2D ordered test data of ISCAS benchmark circuits
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
