Error modeling in board test

Abstract

The testing of electronic circuit boards suffers from two types of errors: Type I error occurs when a goo$ circuit board fails the test while Type II error occurs when a defectzve circuit board passes the test. Both of these errors should be considered in modeling the test process although Type II error alone has traditionally been the focus of test improvement egorts. This paper relates both error types to the defect level and to the level of good circuit boards which fail. Actual board test data as analyzed which indicates that the risk of Type I error may be as great as that for Type II error.