Model-Based Design Patterns for describing Test Station and Resource Capabilities

Abstract

The paper considers the various techniques and design patterns available for modelling test station and instrument capabilities, in terms of the resources they have available, the ports any signals would go through, and the test capabilities available at each port. These standard models are used in resource allocation algorithms, to automatically map test requirements to ATE resources, to identify exception reports (missing capabilities), etc. The paper considers modelling resource dependencies in IEEE 1671.2 ATML Instrument Description and IEEE 1671.6 ATML Test Station Description, proposing a set of simple modeling patterns that describe independent, alternative, and concurrent capabilities. The consistent use of these patterns produces ATML capability description that are easy to interpret and update, benefiting the long-term maintainability of the automatic test system.