Theoretical basis and measurement techniques for SSN (Simultaneous switching noise) on FPGA (Field Programmable Gate Array) products

Abstract

With the increase of data rate and clock speed, as well as the decrease of power supply voltage on todaypsilas technology, simultaneous switching noise (SSN) has become critical in order for the entire system to have an error free design. The difference in a few milli-volts may cause the system to fail. Therefore, it is very important to understand the characteristics of the SSN glitch of an active device for correct system-level performance. This paper quantifies the amount of SSN glitch launched from a FPGA into the near end of the printed circuit board (PCB) transmission line without being influenced by the response of the measurement system. It also analyzes practical measurement approaches with different probing methods and measurement methodologies to understand the characteristics of the SSN glitch. This paper is a guide to understand the SSN characteristics for system electronic system designers.