{"title":"Simulation of multiple-bit soft errors induced by cosmic ray neutrons in DRAMs","authors":"Y. Tosaka, S. Satoh","doi":"10.1109/SISPAD.2000.871259","DOIUrl":null,"url":null,"abstract":"Although it has been shown that cosmic ray neutrons play an important role in soft error (SE) phenomena, some important issues in neutron-induced SE phenomena are still to be clarified. In this paper, neutron-induced multiple-bit SEs in 16 Mb DRAMs are investigated numerically using the Neutron-Induced Soft Error Simulator (NISES), and simulated results are compared to experimental data. Scaling effects on multiple-bit SEs, effects of configuration patterns on double-bit SE rates, and the influence of multiple-bit SEs on an error correction code are discussed.","PeriodicalId":132609,"journal":{"name":"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2000.871259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Although it has been shown that cosmic ray neutrons play an important role in soft error (SE) phenomena, some important issues in neutron-induced SE phenomena are still to be clarified. In this paper, neutron-induced multiple-bit SEs in 16 Mb DRAMs are investigated numerically using the Neutron-Induced Soft Error Simulator (NISES), and simulated results are compared to experimental data. Scaling effects on multiple-bit SEs, effects of configuration patterns on double-bit SE rates, and the influence of multiple-bit SEs on an error correction code are discussed.
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