C. Villeneuve-Faure, K. Makasheva, L. Boudou, G. Teyssèdre
{"title":"Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM","authors":"C. Villeneuve-Faure, K. Makasheva, L. Boudou, G. Teyssèdre","doi":"10.1007/978-3-030-15612-1_9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Atomic Force Microscopy for Nanoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-15612-1_9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}