Performance degradation of an LC-tank VCO by impact of digital switching noise

C. Soens, G. V. D. Plas, P. Wambacq, S. Donnay
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引用次数: 20

Abstract

In mixed-signal designs, digital switching noise is an important limitation for the analog and RF performance. This paper reports a thorough experimental and analytical study of the impact of digital switching noise on a 3.5 GHz LC-tank voltage controlled oscillator (VCO) in 0.18 /spl mu/m CMOS. Frequency modulation is recognized as the dominating mechanism behind the impact of digital switching noise in the investigated frequency range (DC to 15 MHz). The dominating coupling path, from the source of noise to the VCO, in this frequency range is via the non-ideal metal ground lines.
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数字开关噪声对LC-tank压控振荡器性能的影响
在混合信号设计中,数字开关噪声是影响模拟和射频性能的重要因素。本文对数字开关噪声对0.18 /spl mu/m CMOS中3.5 GHz LC-tank压控振荡器(VCO)的影响进行了深入的实验和分析研究。在所研究的频率范围内(DC到15mhz),频率调制被认为是影响数字开关噪声的主要机制。在这个频率范围内,从噪声源到压控振荡器的主要耦合路径是通过非理想金属地线。
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