Time-domain EMI measurement methodology

Shih-Yi Yuan, Ting-Wei Yeh, Y. Tang, Chiu-Kuo Chen
{"title":"Time-domain EMI measurement methodology","authors":"Shih-Yi Yuan, Ting-Wei Yeh, Y. Tang, Chiu-Kuo Chen","doi":"10.1109/EMCCOMPO.2015.7358352","DOIUrl":null,"url":null,"abstract":"With substantial progress in Internet of things (IoT), new challenges of EMI on IoT (IoT-EMI) measurement have emerged. The IoT-EMI behaviors are complex and dependent on the target's interactions between hardware and software. A systematic method for IoT-EMI measurement should be developed. However, the characteristics of IoT-EMI are digitally-controlled, time-varying, and software-dependent and make the IoT-EMI measurements difficult by conventional method. This paper proposes a time-domain measurement method for such issue. This method uses a `timestamp' by SW/HW-co-measurement strategy to analysis IoT-EMI behaviors. From the measurement result, the long-term measurements are comparable to the conventional SA measurements. And the software-related IoT-EMI results show tremendous differences - about 5-50 dBuV differences among different application programs are observed. To the best of the authors' knowledge, the software-dependent IoT-EMI behaviors are firstly observed and published.","PeriodicalId":236992,"journal":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2015.7358352","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

With substantial progress in Internet of things (IoT), new challenges of EMI on IoT (IoT-EMI) measurement have emerged. The IoT-EMI behaviors are complex and dependent on the target's interactions between hardware and software. A systematic method for IoT-EMI measurement should be developed. However, the characteristics of IoT-EMI are digitally-controlled, time-varying, and software-dependent and make the IoT-EMI measurements difficult by conventional method. This paper proposes a time-domain measurement method for such issue. This method uses a `timestamp' by SW/HW-co-measurement strategy to analysis IoT-EMI behaviors. From the measurement result, the long-term measurements are comparable to the conventional SA measurements. And the software-related IoT-EMI results show tremendous differences - about 5-50 dBuV differences among different application programs are observed. To the best of the authors' knowledge, the software-dependent IoT-EMI behaviors are firstly observed and published.
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时域电磁干扰测量方法
随着物联网(IoT)的长足发展,物联网(IoT-EMI)测量中电磁干扰的新挑战已经出现。物联网电磁干扰行为是复杂的,依赖于目标的硬件和软件之间的相互作用。应该开发一种系统的物联网电磁干扰测量方法。然而,物联网电磁干扰的特点是数字控制、时变和软件依赖,这使得物联网电磁干扰很难用传统方法测量。针对这一问题,本文提出了一种时域测量方法。该方法使用SW/ hw共同测量策略的“时间戳”来分析物联网emi行为。从测量结果来看,长期测量与常规SA测量相当。与软件相关的物联网电磁干扰结果存在巨大差异,不同应用程序之间的差异约为5-50 dBuV。据作者所知,首先观察并发表了依赖软件的物联网电磁干扰行为。
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