Fabrication of nanopores utilizing SiC/Si(001) heteroepitaxial growth on SOI substrates: nanopore density control

H. Yahaya, Y. Ikoma, K. Kuriyama, T. Motooka
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引用次数: 1

Abstract

We have investigated the nanopore formation utilizing SiC/Si (001) heteroepitaxial growth. Inverse pyramidal pits were produced by {111} faceted on the top of Si layer of Silicon on Insulator (001) substrate after SiC growth by using CH3SiH3 pulse jet chemical vapor deposition. Randomly distributed nanopores with the size of ~10 nm were obtained after dipped into BHF solution for etching the buried oxide layer through the top of the pit. It was found that the densities of the pits and the nanopores strongly depend on the initial SiC nucleation density which can be controlled by the pulse frequency and number of CH3SiH3 pulse jets.
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在SOI衬底上利用SiC/Si(001)异质外延生长制备纳米孔:纳米孔密度控制
我们研究了利用SiC/Si(001)异质外延生长形成纳米孔的方法。采用CH3SiH3脉冲射流化学气相沉积法生长SiC后,在绝缘体(001)衬底上的硅层顶部{111}刻面形成了反金字塔形凹坑。通过凹坑的顶部浸入BHF溶液中刻蚀埋藏的氧化层,得到了尺寸为~10 nm的随机分布的纳米孔。结果表明,微孔和纳米孔的密度与初始碳化硅成核密度密切相关,初始碳化硅成核密度可通过脉冲频率和CH3SiH3脉冲射流的数量来控制。
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