L. Artola, A. A. Youssef, S. Ducret, R. Buiron, S. Parola, G. Hubert, C. Poivey
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引用次数: 4
Abstract
This work presents the measurements of single event transients and functional interrupts on two designs of readout integrated circuit under a heavy ions beam at cryogenic temperatures. The temperature dependence of the SEFI occurrence is limited.
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