GaN growth by MOVPE on patterned SOI substrates: from high-quality GaN platelets to micro LEDs

Kilian Baril, P. Coulon, M. Mrad, L. Dupré, G. Feuillet, M. Charles, C. Gourgon, P. Vennégués, B. Alloing, J. Z. Pérez
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Abstract

This work presents the use of nanopendeo-epitaxy of gallium nitride (GaN) on Silicon-On-Insulator (SOI) nano-pillars to produce 20x20 μm2 low threading dislocation density (TDD) GaN platelets, with a TDD <3×108 cm−2 for their subsequent use as templates for GaN microLEDs. After discussing the general growth strategy, the correlation between optical and structural characterizations will illustrate the behavior of dislocations from the initial GaN/SOI pillars to the GaN platelets surface. Finally, we demonstrate that a state of the art TDD for GaN on silicon lower than 3×108 cm−2 can be achieved by changing the growth mode in Metal Organic Vapor Phase Epitaxy (MOVPE).
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在有图案的SOI衬底上通过MOVPE生长GaN:从高质量GaN血小板到微型led
这项工作介绍了在绝缘体上硅(SOI)纳米柱上使用氮化镓(GaN)的纳米开展-外延技术,生产出20x20 μm2低螺纹位错密度(TDD)的GaN薄片,TDD <3×108 cm−2,随后用作GaN微led的模板。在讨论了一般的生长策略之后,光学和结构表征之间的相关性将说明从初始GaN/SOI柱到GaN血小板表面的位错行为。最后,我们证明了通过改变金属有机气相外延(MOVPE)的生长模式,可以实现低于3×108 cm−2的硅上GaN的TDD。
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