M. Gadlage, M. Kay, David I. Bruce, A. Roach, A. Duncan, Aaron M. Williams, J. D. Ingalls
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引用次数: 3
Abstract
The total dose response of commercially-available floating-gate-alternative non-volatile memories is characterized. The response of MRAM, FRAM, CBRAM, ReRAM, SONOS, and PCRAM devices are compared to a relatively radiation tolerant NAND flash.
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