{"title":"A comparative study of pseudo stuck-at and leakage fault model","authors":"S. Zachariah, S. Chakravarty","doi":"10.1109/ICVD.1999.745130","DOIUrl":null,"url":null,"abstract":"Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.
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