Towards a BIST technique for noise figure evaluation

M. Negreiros, L. Carro, A. Susin
{"title":"Towards a BIST technique for noise figure evaluation","authors":"M. Negreiros, L. Carro, A. Susin","doi":"10.1109/ETSYM.2004.1347624","DOIUrl":null,"url":null,"abstract":"This work presents some results regarding the development of a BIST technique capable of noise figure evaluation. Noise figure is an important parameter in the specification and design of low noise systems, such as communications systems and biomedical instrumentation. A review of published techniques for noise figure evaluation is provided. A new technique aimed to estimate noise figure in a SoC environment is then proposed. The technique is based on the use of a simple and low cost noise generator. Simulation results are provided in order to make an initial evaluation of the feasibility of the proposed approach.","PeriodicalId":358790,"journal":{"name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETSYM.2004.1347624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

This work presents some results regarding the development of a BIST technique capable of noise figure evaluation. Noise figure is an important parameter in the specification and design of low noise systems, such as communications systems and biomedical instrumentation. A review of published techniques for noise figure evaluation is provided. A new technique aimed to estimate noise figure in a SoC environment is then proposed. The technique is based on the use of a simple and low cost noise generator. Simulation results are provided in order to make an initial evaluation of the feasibility of the proposed approach.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
噪声系数评价的BIST技术研究
这项工作提出了一些关于能够评估噪声系数的BIST技术发展的结果。噪声系数是通信系统、生物医学仪器等低噪声系统规格和设计中的一个重要参数。本文对已发表的噪声系数评价方法进行了综述。在此基础上,提出了一种新的SoC环境下噪声系数估计方法。该技术是基于使用一个简单和低成本的噪声发生器。为了初步评估所提出方法的可行性,给出了仿真结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Software development for an open architecture test system Enhanced 3-valued logic/fault simulation for full scan circuits using implicit logic values Mems built-in-self-test using MLS A new BIST scheme for 5GHz low noise amplifiers Accurate tap-delay measurements using a di .erential oscillation technique
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1