{"title":"Fault models and tests for two-port memories","authors":"A. V. Goor, S. Hamdioui","doi":"10.1109/VTEST.1998.670898","DOIUrl":null,"url":null,"abstract":"In this paper the effects of simultaneous memory access on the fault modeling for two-port memories are investigated. New fault models and their march tests are presented. The obtained tests are of order O(n/sup 2/), which makes them less practical for larger two-port memories. However, the complexity can be reduced to O(n), when the memory topology is taken into account.","PeriodicalId":128521,"journal":{"name":"Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"44","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1998.670898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 44
Abstract
In this paper the effects of simultaneous memory access on the fault modeling for two-port memories are investigated. New fault models and their march tests are presented. The obtained tests are of order O(n/sup 2/), which makes them less practical for larger two-port memories. However, the complexity can be reduced to O(n), when the memory topology is taken into account.
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