Back-gate controlled READ SRAM with improved stability

Jae-Joon Kim, Keunwoo Kim, C. Chuang
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引用次数: 6

Abstract

We have presented a novel back-gate controlled UTSOI SRAM cell structure and associated design considerations. The proposed scheme offers improved stability compared with conventional 6T cell, and has less number of transistors than the conventional 10T cell. Due to over 3/spl times/ improvement in SNM even at low VDD and reduced area penalty compared with 10T cell, the proposed 8T cell could be aggressively scaled down. This scheme can also be applied to SRAM cells with asymmetrical DG devices.
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具有改进稳定性的后门控制READ SRAM
我们提出了一种新的后门控制的UTSOI SRAM单元结构和相关的设计考虑。与传统的6T电池相比,该方案具有更高的稳定性,并且比传统的10T电池具有更少的晶体管数量。与10T电池相比,即使在低VDD下,SNM也有超过3/spl的改进,并且面积损失减少,因此拟议的8T电池可以大幅缩小规模。该方案也可应用于不对称DG器件的SRAM单元。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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