Terminology for high-speed sampling-oscilloscope calibration

Dylan F. Williams, T. Clement, P. Hale, A. Dienstfrey
{"title":"Terminology for high-speed sampling-oscilloscope calibration","authors":"Dylan F. Williams, T. Clement, P. Hale, A. Dienstfrey","doi":"10.1109/ARFTG.2006.8361647","DOIUrl":null,"url":null,"abstract":"We discuss procedures for calibrating high-speed sampling oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to use the calibrations to perform traceable oscilloscope measurements.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 68th ARFTG Conference: Microwave Measurement","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2006.8361647","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 33

Abstract

We discuss procedures for calibrating high-speed sampling oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to use the calibrations to perform traceable oscilloscope measurements.
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高速采样-示波器校准术语
我们讨论了在国家标准与技术研究所校准高速采样示波器的程序,以及与这些校准相关的术语。讨论不仅阐明了校准程序,而且阐明了如何使用校准来执行可追溯示波器测量。
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