New lithography excimer light source technology for ArF (193 nm) semiconductor manufacturing

D. Colon
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Abstract

Future argon fluoride (ArF), 193 nm photolithography applications will require excimer light sources to generate very narrow spectral bandwidths at high output power. In order to meet these requirements, the traditional single-gas-discharge-chamber design used by lithography excimer light sources for the past ten years will transition to a new dual-chamber Master Oscillator Power Amplifier (MOPA) technology. MOPA will provide lithographers with significant performance benefits and manufacturing cost advantages at the 193 nm exposure wavelength. This paper will explain MOPA architecture and describe its numerous advantages vis-a-vis the single-chamber design.
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用于ArF (193nm)半导体制造的新型光刻准分子光源技术
未来的193nm氟化氩(ArF)光刻应用将需要准分子光源在高输出功率下产生非常窄的光谱带宽。为了满足这些要求,过去十年中用于光刻准分子光源的传统单气体放电腔设计将过渡到新的双腔主振荡器功率放大器(MOPA)技术。在193nm曝光波长下,MOPA将为光刻工提供显著的性能优势和制造成本优势。本文将解释MOPA结构,并描述其相对于单室设计的众多优势。
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