Characterization of thermally conductive underfill materials for high performance flip-chip applications

M. Chew, M. Ding, E. Wai, S. Chong, V. S. Rao, Min Woo Daniel Rhee
{"title":"Characterization of thermally conductive underfill materials for high performance flip-chip applications","authors":"M. Chew, M. Ding, E. Wai, S. Chong, V. S. Rao, Min Woo Daniel Rhee","doi":"10.1109/EPTC.2012.6507093","DOIUrl":null,"url":null,"abstract":"In this paper, characterization of 3 types of underfill for high performance applications has been presented. Characterizations of underfill materials such as adhesion testing, contact angle measurement on different surfaces, filler size distribution were conducted to understand the underfill materials. The adhesion test results revealed that failure is mainly mixed mode, which is the failure between bulk underfill failure and interfacial failure. The thermal conductive underfill has a wider range of filler sizes and has the most hydrophilic behavior. From the glass chip flow test, the flow behavior of the underfill could be observed, with the most thermal conductive underfill having the slowest flow. Process optimization for thermal chip and daisy chain chip for void free underfill was also carried out based on dispensing temperature and patterns.","PeriodicalId":431312,"journal":{"name":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2012.6507093","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

In this paper, characterization of 3 types of underfill for high performance applications has been presented. Characterizations of underfill materials such as adhesion testing, contact angle measurement on different surfaces, filler size distribution were conducted to understand the underfill materials. The adhesion test results revealed that failure is mainly mixed mode, which is the failure between bulk underfill failure and interfacial failure. The thermal conductive underfill has a wider range of filler sizes and has the most hydrophilic behavior. From the glass chip flow test, the flow behavior of the underfill could be observed, with the most thermal conductive underfill having the slowest flow. Process optimization for thermal chip and daisy chain chip for void free underfill was also carried out based on dispensing temperature and patterns.
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高性能倒装芯片用导热下填料的表征
本文介绍了三种用于高性能应用的底填料的特性。对底填材料进行了附着力测试、不同表面接触角测量、填料粒径分布等表征,以了解底填材料。黏附试验结果表明,破坏主要为混合型破坏,即充填体破坏与界面破坏之间的破坏。导热底填料具有较宽的填料尺寸范围和最亲水的性能。通过玻璃屑流动试验可以观察到底填料的流动特性,导热性最强的底填料流动最慢。基于点胶温度和点胶方式,对无空隙底填料的热芯片和菊花链芯片工艺进行了优化。
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