An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability

C. Tai, H. Y. Lim, C. H. Teo, P. J. A. Swee
{"title":"An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability","authors":"C. Tai, H. Y. Lim, C. H. Teo, P. J. A. Swee","doi":"10.1109/IEMT.2012.6521745","DOIUrl":null,"url":null,"abstract":"The increase of gold price had pushed industrial to develop copper wire in order to stay competitive. However, copper is not precious material like gold, there are numerous challenges in bonding & reliability risk associated with stringent automotive reliability requirements. Corrosion associated with copper wire bonding is considered one of the hard to solve reliability risk as the occurrence is in very low ppm and there was no specific pattern observed on the corroded bondpad location. This paper is focusing on the copper wire interconnect with Aluminum pad corrosion in humidity test including autoclave and temperature humidity bias test.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521745","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

The increase of gold price had pushed industrial to develop copper wire in order to stay competitive. However, copper is not precious material like gold, there are numerous challenges in bonding & reliability risk associated with stringent automotive reliability requirements. Corrosion associated with copper wire bonding is considered one of the hard to solve reliability risk as the occurrence is in very low ppm and there was no specific pattern observed on the corroded bondpad location. This paper is focusing on the copper wire interconnect with Aluminum pad corrosion in humidity test including autoclave and temperature humidity bias test.
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汽车可靠性铜焊丝腐蚀及缓解技术研究
黄金价格的上涨促使工业界为了保持竞争力而开发铜线。然而,铜不像黄金那样珍贵,在严格的汽车可靠性要求下,在粘合和可靠性风险方面存在许多挑战。由于铜线连接的腐蚀发生率非常低,并且在腐蚀的连接板位置没有观察到特定的模式,因此被认为是难以解决的可靠性风险之一。本文主要研究了铜线互连铝板在高压灭菌器和温度湿度偏置试验中的腐蚀问题。
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