{"title":"Machine Learning for Optimized Scheduling in Complex Semiconductor Equipment","authors":"Doug Suerich, Terry Young","doi":"10.1109/ASMC.2019.8791767","DOIUrl":null,"url":null,"abstract":"Semiconductor cluster equipment adds an integral component to the modern semiconductor manufacturing process. These complex tools provide a flexible deployment option to group multiple processing steps into a single piece of equipment, allowing for more efficient processing. They also contribute to a reduction in the number of times a wafer must go through the atmospheric-vacuum- atmospheric cycle. Such highly automated tools present a complex scheduling challenge where process-specific requirements are balanced against a need to achieve maximum wafer throughput in a fault-tolerant manner. Software engineers typically build schedulers using a set of manually- configured heuristics but this can be a labor-intensive process where small changes to the cluster configuration or process requirements can require large changes to the scheduler. Our motivation for this work was to investigate whether a machine learning approach to complex cluster scheduling could be developed more efficiently and at a lower cost than existing methods.","PeriodicalId":287541,"journal":{"name":"2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2019.8791767","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Semiconductor cluster equipment adds an integral component to the modern semiconductor manufacturing process. These complex tools provide a flexible deployment option to group multiple processing steps into a single piece of equipment, allowing for more efficient processing. They also contribute to a reduction in the number of times a wafer must go through the atmospheric-vacuum- atmospheric cycle. Such highly automated tools present a complex scheduling challenge where process-specific requirements are balanced against a need to achieve maximum wafer throughput in a fault-tolerant manner. Software engineers typically build schedulers using a set of manually- configured heuristics but this can be a labor-intensive process where small changes to the cluster configuration or process requirements can require large changes to the scheduler. Our motivation for this work was to investigate whether a machine learning approach to complex cluster scheduling could be developed more efficiently and at a lower cost than existing methods.