Advanced RDL Interposer PKG Technology for Heterogeneous Integration

Jae-gwon Jang, Kyoung-Lim Suk, S. Lee, Jinha Park, Gwang-jae Jeon, Jung-ho Park, Jeong-gi Jin, Su-chang Lee, Gyoung-bum Kim, Joonhyuk Choi, Dae-woo Kim, D. Oh, Won-Kyoung Choi
{"title":"Advanced RDL Interposer PKG Technology for Heterogeneous Integration","authors":"Jae-gwon Jang, Kyoung-Lim Suk, S. Lee, Jinha Park, Gwang-jae Jeon, Jung-ho Park, Jeong-gi Jin, Su-chang Lee, Gyoung-bum Kim, Joonhyuk Choi, Dae-woo Kim, D. Oh, Won-Kyoung Choi","doi":"10.23919/IWLPC52010.2020.9375895","DOIUrl":null,"url":null,"abstract":"As faster data processing and communication gets more demanded for Data Center/Cloud, HPC (High Performance Computing), AI (Artificial Intelligence) accelerator and Network markets, HBM (High Bandwidth Memory) becomes main memory type to meet the required bandwidth performance. HBM integration with logic dies in a system level has been developed on 2.5D SiP (System in Package) Platform with Si Interposer having TSV (Through Silicon Vias) of which fabrication cost is rather high. Therefore, as the low cost solution, alternative 2.5D SiP Platform approaches such as Organic Interposer using Redistribution Layer (RDL) and Glass Interposer have recently been reported. In this paper, RDL Interposer package with 4 HBM and 1 logic is demonstrated as 2.5D package platform based on RDL-First Fan-out Wafer Level Package (FOWLP). The effect of RDL design factors on electrical performances is investigated using the eye diagram method and fine pitch multi-layer RDL structure (2um L/S RDL, 4 Layers) is designed accordingly. Fine pitch RDL process is established followed by the wafer level and unit level assembly processes and RDL Interposer package is confirmed to meet all the reliability requirements.","PeriodicalId":192698,"journal":{"name":"2020 International Wafer Level Packaging Conference (IWLPC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Wafer Level Packaging Conference (IWLPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/IWLPC52010.2020.9375895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

As faster data processing and communication gets more demanded for Data Center/Cloud, HPC (High Performance Computing), AI (Artificial Intelligence) accelerator and Network markets, HBM (High Bandwidth Memory) becomes main memory type to meet the required bandwidth performance. HBM integration with logic dies in a system level has been developed on 2.5D SiP (System in Package) Platform with Si Interposer having TSV (Through Silicon Vias) of which fabrication cost is rather high. Therefore, as the low cost solution, alternative 2.5D SiP Platform approaches such as Organic Interposer using Redistribution Layer (RDL) and Glass Interposer have recently been reported. In this paper, RDL Interposer package with 4 HBM and 1 logic is demonstrated as 2.5D package platform based on RDL-First Fan-out Wafer Level Package (FOWLP). The effect of RDL design factors on electrical performances is investigated using the eye diagram method and fine pitch multi-layer RDL structure (2um L/S RDL, 4 Layers) is designed accordingly. Fine pitch RDL process is established followed by the wafer level and unit level assembly processes and RDL Interposer package is confirmed to meet all the reliability requirements.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
面向异构集成的先进RDL Interposer PKG技术
随着数据中心/云、HPC(高性能计算)、AI(人工智能)加速器和网络市场对更快的数据处理和通信的需求越来越高,HBM(高带宽内存)成为满足带宽性能要求的主要内存类型。在具有TSV (Through Silicon Vias)的Si Interposer的2.5D SiP (system in Package)平台上开发了系统级HBM集成逻辑芯片,其制造成本相当高。因此,作为低成本的解决方案,替代的2.5D SiP平台方法,如使用再分配层(RDL)的有机中间层和玻璃中间层,最近被报道。本文以RDL- first扇出晶圆级封装(FOWLP)为基础,以4 HBM和1逻辑的RDL Interposer封装为2.5D封装平台。采用眼图法研究了RDL设计因素对电性能的影响,并据此设计了细间距多层RDL结构(2um L/S RDL, 4层)。建立了小间距RDL工艺,随后进行了晶圆级和单元级组装工艺,并确认了RDL Interposer封装满足所有可靠性要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
New X-Ray Tubes for Wafer Level Inspection Optimizing X-Ray Inspection for Advanaced Packaging Applications Design Process & Methodology for Achieving High-Volume Production Quality for FOWLP Packaging Handling of Different FOPLP Layouts on Large Area Thermal Chucks A Study About Facile Interconnect Formations Involving SB2-JET Solder Ball Stacking and Colonnade Patterning in Hybrid Package Architectures
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1