{"title":"Modeling test cost of ownership","authors":"D. Dance","doi":"10.1109/ICEDTM.1994.496087","DOIUrl":null,"url":null,"abstract":"Increasing cost of test is a major semiconductor industry issue.\nThis report discusses the total life-cycle cost for a set of test\nequipment required to test one product or test equipment cost of\nownership (COO). This is one of many cost control methods used by the\nsemiconductor industry. Modeling test equipment cost of ownership\nprovides an important tool for identifying, measuring, and responding to\nthe challenges of increasing test cost","PeriodicalId":319739,"journal":{"name":"Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEDTM.1994.496087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Increasing cost of test is a major semiconductor industry issue.
This report discusses the total life-cycle cost for a set of test
equipment required to test one product or test equipment cost of
ownership (COO). This is one of many cost control methods used by the
semiconductor industry. Modeling test equipment cost of ownership
provides an important tool for identifying, measuring, and responding to
the challenges of increasing test cost
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