Detecting stuck-open faults with stuck-at test sets

1989 Proceedings of the IEEE Custom Integrated Circuits Conference Pub Date : 1989-05-15 DOI:10.1109/CICC.1989.56809

S. Millman, E. McCluskey

引用次数: 24

Abstract

Simulations of CMOS combinational circuits have been conducted to determine the relationship between stuck-at and stuck-open fault coverage. The results suggest that node activity is more important to stuck-open fault coverage than test length by itself. Reordering test sets so that node activity is increased resulted in increased stuck-open fault coverage. It is important to note that the reordering of the test sets requires an analysis of fault-free simulations; no fault simulations need to be done. It has been shown that all but some minimum-length test sets can easily achieve the 75% stuck-open fault coverage required by the DoD (US Department of Defense), and pseudorandom tests, which have high measures of node activity, can be expected to have over 90% stuck-open fault coverage

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用卡在测试集检测卡开故障

对CMOS组合电路进行了仿真，以确定卡断和卡开故障覆盖率之间的关系。结果表明，节点活动性比测试长度本身对卡断故障覆盖率的影响更大。重新排序测试集，以便增加节点活动，从而增加卡开故障覆盖率。值得注意的是，测试集的重新排序需要对无故障模拟进行分析;不需要进行故障模拟。研究表明，除了一些最小长度的测试集之外，所有测试集都可以很容易地达到DoD(美国国防部)要求的75%的卡开故障覆盖率，而具有高节点活动度量的伪随机测试可以期望具有超过90%的卡开故障覆盖率

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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1989 Proceedings of the IEEE Custom Integrated Circuits Conference

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