Explicit model for tunneling and thermionic current in Schottky barrier Double-Gate MOSFETs

M. Schwarz, T. Holtij, A. Kloes, B. Iñíguez
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引用次数: 1

Abstract

In this paper we present a new approach to calculate the tunneling and thermionic current in Schottky barrier Double-Gate MOSFETs (SB-DG-MOSFETs). This prediction is based on a physics-based two-dimensional analysis. Analytical approximations for the spatial tunneling current density and carrier distributions in the channel are introduced. From this explicit analytical model equations for the tunneling current are derived in closed-form which inherently include two-dimensional effects on the tunneling probability and the carrier distributions. Furthermore, an explicit analytical model equation for the thermionic current is derived. Comparison of the current with an already existing analytical numerical model and TCAD simulation data are in a good agreement for channel lengths down to 22nm.
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肖特基势垒双栅mosfet中隧穿和热离子电流的显式模型
本文提出了一种计算肖特基势垒双栅mosfet (sb - dg - mosfet)隧穿电流和热离子电流的新方法。这一预测是基于基于物理的二维分析。介绍了空间隧道电流密度和载流子分布的解析近似。从这个显式解析模型推导出封闭形式的隧穿电流方程,该方程固有地包含了对隧穿概率和载流子分布的二维影响。进一步推导了热离子电流的解析模型方程。将电流与现有的解析数值模型和TCAD仿真数据进行比较,可以很好地将通道长度降低到22nm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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