{"title":"Empirical computation of reject ratio in VLSI testing","authors":"Shashank K. Mehta, S. Seth","doi":"10.1109/ICVD.1999.745205","DOIUrl":null,"url":null,"abstract":"Among significant components of testing cost are test-length, reject ratio, and lost-yield. In this paper a new approach is proposed to estimate the reject ratio. The empirical model is based on test-data properties that are believed to be invariant for a wide range of manufacturing technologies and types of tests. The analysis is carried out entirely in terms of the device test data, as might be available from a wafer probe. Experimental results demonstrate the robustness of the model.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745205","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Among significant components of testing cost are test-length, reject ratio, and lost-yield. In this paper a new approach is proposed to estimate the reject ratio. The empirical model is based on test-data properties that are believed to be invariant for a wide range of manufacturing technologies and types of tests. The analysis is carried out entirely in terms of the device test data, as might be available from a wafer probe. Experimental results demonstrate the robustness of the model.
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