Dong-Sun Min Dong-Sun Min, Dong-Il Seo Dong-Il Seo, Jehwan You Jehwan You, Sooin Cho Sooin Cho, Daeje Chin Daeje Chin, Y.E. Park
{"title":"Wordline coupling noise reduction techniques for scaled DRAMs","authors":"Dong-Sun Min Dong-Sun Min, Dong-Il Seo Dong-Il Seo, Jehwan You Jehwan You, Sooin Cho Sooin Cho, Daeje Chin Daeje Chin, Y.E. Park","doi":"10.1109/VLSIC.1990.111105","DOIUrl":null,"url":null,"abstract":"The wordline architecture of the twisted word line (TWL) scheme and a wordline latch circuit for suppressing wordline coupling noise have been proposed and demonstrated. Using this approach, wordline coupling noise is reduced by 70% compared to the conventional wordline structure. This technique was found to be effective for suppressing wordline coupling noise with minimum layout penalty in scaled high-density DRAMs","PeriodicalId":239990,"journal":{"name":"Digest of Technical Papers., 1990 Symposium on VLSI Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Technical Papers., 1990 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1990.111105","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
The wordline architecture of the twisted word line (TWL) scheme and a wordline latch circuit for suppressing wordline coupling noise have been proposed and demonstrated. Using this approach, wordline coupling noise is reduced by 70% compared to the conventional wordline structure. This technique was found to be effective for suppressing wordline coupling noise with minimum layout penalty in scaled high-density DRAMs