A new high density organic laminate for high pin-count flip chip packages

S. Takami, M. Hori, M. Arikawa, T. Matsuoka, Y. Hiramatsu, Y. Iwata, Masaharu Hotehama, K. Hayashi
{"title":"A new high density organic laminate for high pin-count flip chip packages","authors":"S. Takami, M. Hori, M. Arikawa, T. Matsuoka, Y. Hiramatsu, Y. Iwata, Masaharu Hotehama, K. Hayashi","doi":"10.1109/ECTC.2002.1008083","DOIUrl":null,"url":null,"abstract":"By applying 'simultaneous curing' substrates for core substrates, we developed an ultra high transmission speed build up substrate (called Super HDBU/spl reg/) which is applicable for flip chip packages with over 3,000 I/O. Most build up interconnected substrates have been using a PWB with plated through holes (PTH) as the core substrate. Considering the form density of interconnects and transmission speed, this core with PTH has become a barrier by dividing the top and bottom surface of the substrate. Also, design interconnection lines are limited to the top side of the build up substrate which mounts the LSI devices. As for the solution to these issues, we have developed a new process of simultaneous curing with a copper foil transfer method onto an uncured prepreg. The simultaneous curing substrate method makes it possible to design signal interconnection lines on build up layers on both the top and bottom surfaces of the core substrate. In addition, it provides much finer via and narrower via pitch design on the core substrate which enables full grid area design instead of peripheral design.","PeriodicalId":285713,"journal":{"name":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2002.1008083","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

By applying 'simultaneous curing' substrates for core substrates, we developed an ultra high transmission speed build up substrate (called Super HDBU/spl reg/) which is applicable for flip chip packages with over 3,000 I/O. Most build up interconnected substrates have been using a PWB with plated through holes (PTH) as the core substrate. Considering the form density of interconnects and transmission speed, this core with PTH has become a barrier by dividing the top and bottom surface of the substrate. Also, design interconnection lines are limited to the top side of the build up substrate which mounts the LSI devices. As for the solution to these issues, we have developed a new process of simultaneous curing with a copper foil transfer method onto an uncured prepreg. The simultaneous curing substrate method makes it possible to design signal interconnection lines on build up layers on both the top and bottom surfaces of the core substrate. In addition, it provides much finer via and narrower via pitch design on the core substrate which enables full grid area design instead of peripheral design.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于高引脚数倒装芯片封装的新型高密度有机层压板
通过将“同步固化”基板应用于核心基板,我们开发了一种超高传输速度的基板(称为Super HDBU/spl reg/),适用于具有超过3,000个I/O的倒装芯片封装。大多数构建互连基板一直使用镀通孔(PTH)作为核心基板的PWB。考虑到互连的形式密度和传输速度,这种带PTH的芯通过划分基板的上下表面而成为屏障。此外,设计互连线仅限于安装LSI器件的构建基板的顶部。为了解决这些问题,我们开发了一种新的方法,即在未固化的预浸料上使用铜箔转移方法同时固化。同时固化基板方法使得在核心基板的顶部和底部表面的构建层上设计信号互连线成为可能。此外,它在核心基板上提供了更细的通孔和更窄的通孔间距设计,从而实现了全网格区域设计,而不是外围设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Micropackaging using thin films as mechanical components Reaction kinetics of Pb-Sn and Sn-Ag solder balls with electroless Ni-P/Cu pad during reflow soldering in microelectronic packaging Low cost uncooled mini-DIL module for pump laser Transient three dimensional simulation of mold filling and wire sweep in an overmold BGA package A novel, wafer-scale technology for addressing process and cost obstacles associated with underfilling FCOB
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1