{"title":"A self-testing ALU using built-in current sensing","authors":"P. Nigh, Wojciech Maly","doi":"10.1109/CICC.1989.56807","DOIUrl":null,"url":null,"abstract":"A CMOS ALU (arithmetic logic unit) chip containing built-in current (BIC) sensors, which perform self-testing of the ALU, is described. The performance of two ALUs (one with and one without a BIC sensor) is analyzed by using externally applied test vectors and linear feedback shift register for BIC and for stuck-fault testing. The results demonstrate that the BIC testing methodology is well suited for initial die testing of CMOS ICs as well as for concurrent self-testing of highly reliable systems","PeriodicalId":165054,"journal":{"name":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1989.56807","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 47
Abstract
A CMOS ALU (arithmetic logic unit) chip containing built-in current (BIC) sensors, which perform self-testing of the ALU, is described. The performance of two ALUs (one with and one without a BIC sensor) is analyzed by using externally applied test vectors and linear feedback shift register for BIC and for stuck-fault testing. The results demonstrate that the BIC testing methodology is well suited for initial die testing of CMOS ICs as well as for concurrent self-testing of highly reliable systems
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